Test that we don't have a memory leak in d2i_ASN1_OBJECT.

Fixes #14667

Reworked test supplied by @smcpeak into a unit test.

Reviewed-by: Richard Levitte <levitte@openssl.org>
(Merged from https://github.com/openssl/openssl/pull/14938)

(cherry picked from commit 7c65179ad9)
This commit is contained in:
Shane Lontis 2021-04-21 13:49:29 +10:00 committed by Richard Levitte
parent 1727465471
commit e466dc3646

View File

@ -12,6 +12,7 @@
#include <openssl/rand.h>
#include <openssl/asn1t.h>
#include <openssl/obj_mac.h>
#include "internal/numbers.h"
#include "testutil.h"
@ -195,6 +196,30 @@ static int test_invalid_template(void)
return 0;
}
static int test_reuse_asn1_object(void)
{
static unsigned char cn_der[] = { 0x06, 0x03, 0x55, 0x04, 0x06 };
static unsigned char oid_der[] = {
0x06, 0x06, 0x2a, 0x03, 0x04, 0x05, 0x06, 0x07
};
int ret = 0;
ASN1_OBJECT *obj;
unsigned char const *p = oid_der;
/* Create an object that owns dynamically allocated 'sn' and 'ln' fields */
if (!TEST_ptr(obj = ASN1_OBJECT_create(NID_undef, cn_der, sizeof(cn_der),
"C", "countryName")))
goto err;
/* reuse obj - this should not leak sn and ln */
if (!TEST_ptr(d2i_ASN1_OBJECT(&obj, &p, sizeof(oid_der))))
goto err;
ret = 1;
err:
ASN1_OBJECT_free(obj);
return ret;
}
int setup_tests(void)
{
#ifndef OPENSSL_NO_DEPRECATED_3_0
@ -205,5 +230,6 @@ int setup_tests(void)
ADD_TEST(test_int64);
ADD_TEST(test_uint64);
ADD_TEST(test_invalid_template);
ADD_TEST(test_reuse_asn1_object);
return 1;
}