Mike Frysinger b31ff1f79b sim: cris: drop custom "dynamic" test field ... This tag is used to force tests to be built dynamically (i.e. without -static linking). This is because cris-sim.exp in dejagnu turns on static linking in ldflags. The default configs and runtest flags shouldn't load these boards. If these settings are still needed, we should figure out a different way of suppressing the stock settings wholesale. We want these to all pass out of the box with little to no configuration so that they can run in a multitarget build. With dropping "dynamic", it'll be easier to merge the custom cris test logic with the common sim test logic.		2021-11-16 20:06:44 -05:00
..
aarch64
arm	sim: testsuite: delete unused arm remote host logic	2021-11-10 21:58:08 -05:00
avr
bfin	sim: bfin: fix mach/xfail usage in tests	2021-11-15 01:35:49 -05:00
bpf
common
config
cr16
cris	sim: cris: drop custom "dynamic" test field	2021-11-16 20:06:44 -05:00
d10v
example-synacor	sim: synacor: simplify test generation	2021-11-10 21:45:43 -05:00
frv
ft32
h8300
iq2000
lib	sim: testsuite: drop sim_compile cover function	2021-11-11 02:07:10 -05:00
lm32
m32c
m32r
m68hc11
mcore
microblaze
mips
mn10300
moxie
msp430
or1k
pru
riscv
sh
v850
.gitignore
ChangeLog-2021
local.mk	sim: testsuite: add more silent build rules	2021-11-16 19:33:57 -05:00