binutils-gdb/sim/testsuite/frv/interrupts/compound.cgs

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# frv testcase to generate compound exception
# mach: fr500 frv
.include "testutils.inc"
start
.global align
align:
and_spr_immed -4081,tbr ; clear tbr.tt
set_gr_spr tbr,gr17
inc_gr_immed 0x200,gr17 ; address of exception handler
set_bctrlr_0_0 gr17
set_spr_immed 128,lcr
set_spr_addr ok1,lr
or_spr_immed 0x04000000,fsr0 ; enabled div/0 fp_exception
set_psr_et 1
set_gr_immed 0,gr15
set_fr_iimmed 0x7f7f,0xffff,fr0
set_fr_iimmed 0x0000,0x0000,fr1
and_spr_immed 0xfffffffe,isr ; enable mem_address_not_aligned
set_gr_addr store,gr16
set_gr_addr dividei,gr17
set_gr_immed 0xdeadbeef,gr8
inc_gr_immed 2,sp ; misalign
store: sti.p gr8,@(sp,0) ; misaligned write
dividef:fdivs.p fr0,fr1,fr2 ; fp_exception
dividei:sdiv gr1,gr0,gr1 ; division exception
test_gr_immed 1,gr15
pass
; exception handler
ok1:
; check interrupt on store
test_spr_immed 0x102,esfr1 ; esr8 and esr1 are active
test_spr_gr epcr8,gr16
test_spr_bits 0x0001,0,0x1,esr8 ; esr8 is valid
test_spr_bits 0x003e,1,0xb,esr8 ; esr8.ec is set
test_spr_bits 0x0800,11,0x1,esr8 ; esr8.eav is set
test_spr_gr ear8,sp
test_spr_bits 0x01000,12,0x1,esr8 ; esr8.edv is set
test_spr_bits 0x1e000,13,0x3,esr8 ; esr8.edn is 3
test_spr_gr edr3,gr8 ; edr3 is set
; check on fp_exception
test_spr_bits 0x100000,20,0x1,fsr0 ; fsr0.qne is set
test_spr_bits 0xe0000,17,0x1,fsr0 ; fsr0.ftt is set
test_spr_bits 0xfc00,10,0x0,fsr0 ; fsr0.aexc is clear
test_spr_bits 0x80000000,31,0x0,fqst2 ; fq2.miv is set
test_spr_bits 0x18000,15,0x0,fqst2 ; fq2.sie is set
test_spr_bits 0x380,7,0x1,fqst2 ; fq2.ftt is set
test_spr_bits 0x7e,1,0x4,fqst2 ; fq2.cexc is set
test_spr_bits 0x1,0,0x1,fqst2 ; fq2.valid is set
test_spr_immed 0x05e40241,fqop2 ; fq2.opc
; check interrupt on dividei
test_spr_gr epcr1,gr17
test_spr_bits 0x0001,0,0x1,esr1 ; esr1 is valid
test_spr_bits 0x003e,1,0x13,esr1 ; esr1.ec is set
inc_gr_immed 1,gr15
rett 0
fail